Commitees

Steering committee of IIIAE

T. Shiotani	President　(Kyoto University, Japan)
H. Moriya	Vice-president and chair of RTCAE of JSNDI　(Tohoku University, Japan)
Y. Mizutani	Secretary and director of JSNDI　(Tokyo Institute of Technology, Japan)
M. Sause	Representatives of EWGAE　(University of Augsburg, Germany)
I. J. Baran	Representatives of EWGAE　(Office of Technical Inspection, Poland)
A. N. Anastasopoulos	Representatives of EWGAE　(Mistras Group Hellas A.B.E.E., Greece)
G. Manthei	Associated Editor of EWGAE in IIIAE　(University of Applied Sciences, Germany)
V. Godinez	Representative of AEWG　(MISTRAS Group, Inc., USA)
A. Kontsos	Representative of AEWG　(Rowan University, USA)
O. Ley	Representative of AEWG　(MISTRAS Group, Inc., USA)

H. Moriya (Chair)	Tohoku University
H. Cho	Aoyama Gakuin University
M. Enoki	The University of Tokyo
K. Hashimoto	Hokkaido University
K. Ito	National institute for Materials Science (NIMS)
M. T. I. Khan	Saga University
M. Maeda	Chiyoda Corporation
T. Matsuo	Meiji University
Y. Mizutani	Tokyo Institute of Technology
H. Nakamura	IHI Inspection & Instrumentation Co., Ltd.
S. Nishimoto	Soundness Evaluation Technology Lab. Co., Ltd.
S. Nishinoiri	Central Research Institute of Electric Power Industry
K. Ohno	Tokyo Metropolitan University
N. Okude	Tokai Technology Center
T. Sakai	Saitama University
T. Shiotani	Kyoto University
T. Shiraiwa	The University of Tokyo
M. Shiwa	Happy Science University
T. Suzuki	Niigata University
S. Wakayama	Tokyo Metropolitan University
T. Watanabe	The University of Tokushima
I. Yamamoto	Fuji Ceramics Corporation
T. Yasuda	National Institute of Technology, Anan College
H. Yuki	The University of Electro-Communications
K. Watabe	Toshiba Corporation

N. Okude(Chair)	Tokai Technology Center
K. Watabe(Vice-chair)	Toshiba Corporation
T. Watanabe	The University of Tokushima
K. Ito	National institute for Materials Science (NIMS)
K. Ohno	Tokyo Metropolitan University
T. Sakai	Saitama University
T. Shiraiwa	The University of Tokyo
T. Matsuo	Meiji University
T. Yasuda	National Institute of Technology, Anan College
I. Yamamoto	Fuji Ceramics Corporation
H. Asaue	Kyoto University
H. Ito	Kyoto University
T. IInuma	Tokai Technology Center
Y. Nikawa	Tokai Technology Center
N. Kimura	Tokai Technology Center
K. Takagi	IPH Method Association
T. Higashimori	IPH Method Association

A. N. Anastasopoulos	Mistras Group Hellas A.B.E.E., Greece
D. G. Aggelis	Vrije Universiteit Brussel, Belgium
I. J. Baran	Office of Technical Inspection, Cracow, Poland
A. J. Brunner	Retired Scientist, Zuerich, Switzerland
H. K. Chai	University of Edinburgh, Scotland
M. Y. Choi	Korea Research Institute of Standards and Science, Korea
A. Gallego	Universidad of Granada, Spain
N. Godin	INSA, France
V. Godinez	MISTRAS Holdings
T. Kek	University of Ljubljana, Slovenia
A. Kontsos	Rowan University, U.S.A.
D. Kosnik	CTL Group, U.S.A.
M. C. Forde	University of Edinburgh, Scotland
Y. Yang	Delft University of Technology, The Netherlands
G. Lacidogna	Politecnico di Torino, Italy
G. Manthei	THM – University of Applied Sciences, Germany
K. Ono	University of California, Los Angeles, U.S.A.
D. Ozevin	University of Illinois Chicago, U.S.A.
R. Pullin	Cardiff University, U.K.
P. L. Pahalavan	Delft University of Technology, The Netherlands
G. Qi	The University of Memphis, U.S.A.
C. R. Rios-Soberanis	Scientific Research Center of Yucatan, Mexico
M. Sause	University of Augsburg, Germany
H. Vallen	Vallen Systeme, Germany
E. Verstynge	KU Leuven, Belgium
D. Yoon	Korea Research Institute of Standards and Science, Korea
G. Shen	China Special Equipment Inspection and Research Institute, China
F. Roemer	Fraunhofer Institute for Nondestructive Testing IZFP, Germany